Modeling, Analysis, and Instrumentation in Scanning Probe Microscopy
Scanning Probe Microscopes (SPM), which include devices such as Scanning Tunneling Microscope (STM) and Atomic Force Microscope (AFM), with their ability to probe various properties of matter at the atomic scale, together with the ability to operate in different environments, are having a dramatic impact on fields as diverse as biology, materials science, electrochemistry, tribology, biochemistry, surface physics, and medicine. In the last decade a considerable progress has been made in various aspects of scanning probe microscopy that are bringing the goal of routine atomic-scale investigation, manipulation and control of matter closer to reality.
This symposium will be dedicated to research in this direction. Any research that relates to instrumentation aspects of SPM will be considered for this symposium. The topics include but are not restricted to
(1)System theoretic modeling, analysis, theory for SPM
(2)Design and characterization of sensors, actuators, flexure stages, and related instrumentation for SPMs
(3)Analysis and strategies for existing operational modes of SPM
(4)Development of new modes of operations for SPMs
Organizers
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Srinivasa M Salapaka
Department of Mechanical Science and Engineering, UIUC
217-244-4172
salapaka@uiuc.edu
Schedule
Monday 4
| Room | Time | Talk |
|---|---|---|
| Loyalty Room | 4:00 PM |
Contact Resonance Atomic Force Microscopy for Viscoelasticity Philip Yuya, Donna C. Hurley, Joseph A. Turner |
| Loyalty Room | 4:20 PM |
Investigation of Interface Properties by Nanoscale Elastic Modulus Mapping Doron Shilo, Haika Drezner, Avraham Dorogoy |
| Loyalty Room | 4:40 PM |
Quantitative Measurement for Lateral Force Microscopy: a Diamagnetic-Levitation Spring System Qunyang Li, Kyung-Suk Kim, Allan Rydberg |
| Loyalty Room | 5:00 PM |
A New Approach to Achieve Broadband Measurement of Frequency Dependent Viscoelasticity at Nano-scale by AFM Qingze Zou, Zhonghua Xu |
| Loyalty Room | 5:20 PM |
Scanning Force Microscopy based Characterization for Specific Binding of Analyte and DNA Aptamers Pranav Shrotriya, Janice Marquardt, Marit Nilsen-Hamilton |
Tuesday 1
| Room | Time | Talk |
|---|---|---|
| Loyalty Room | 8:00 AM |
MEMS Devices for In-situ Testing and Metrology Placid Ferreira, Jingyan Dong, Deepkishore Mukhopadhyay, Eakkachai Pengwang |
| Loyalty Room | 8:40 AM |
Extending the SPM Operating Range from 100 microns to 10 mm: XY Nanopositioner Design Challenges and Potential Solutions Shorya Awtar, Gaurav Parmar |
| Loyalty Room | 9:00 AM |
Real-time detection and reduction of probe-loss in atomic force microscopy Pranav Agarwal, Murti Salapaka |
| Loyalty Room | 9:20 AM |
Two Degree of Freedom Design for Nanopositioning Systems:
Fundamental Limitations, Control Design, and Related Trade-offs Chibum Lee |
Tuesday 2
| Room | Time | Talk |
|---|---|---|
| Loyalty Room | 11:00 AM |
A non-raster approach to scanning force microscopy Sean Andersson, Peter Chang |
| Loyalty Room | 11:20 AM |
Removal of artifacts for better nanoscale normal and lateral force imaging in atomic force microscopy Srinivasa Salapaka, A. Shegaonkar, C. Lee |
